Define the following properties in the device definition’s
Automated Loop Test Configuration pane. You can
also apply an automated loop test template or a master device definition to
populate some of the fields in the pane.
These properties apply to HART and WirelessHART devices with the HART
analog input signal type. Changes to these properties do not require a
download.
- Test Readback Path
- The path to the parameter in the associated module that the test
uses for comparison. The test compares this parameter value to the
Expected Readback Values at each test step.
- Test Readback Scale
- The low (EU0) and high (EU100) endpoints of the engineering units
range for the expected value.
- Number of Test Steps
- The number of test points for the loop test.
- Test Value (%)
- For each step, the value sent to the device as its fixed output.
The software calculates the
Expected Readback Values
based on the test value and the scale.
- Expected Value Tolerance
- The amount the actual value can deviate from the expected value
and still pass the test, specified in percent of span. For example, if the low
engineering units value is 0 and the low value tolerance is 1.5, an acceptable
actual value would be 0 +/- 1.5.
- Settling Time
- The wait time between writing the test value and reading the
expected value. Select from one of the values in the drop-down list. The
software calculates the value of
Automatic as follows: 3 seconds + (2 *
module scan rate).
- Apply Square Root
- Select
ON if the function block that references the
device performs indirect square root linearization.