Automated loop test properties for an analog output device

Define the following properties in the device definition’s Automated Loop Test Configuration pane. You can also apply an automated loop test template or a master device definition to populate some of the fields in the pane.

These properties apply to HART and WirelessHART devices with the HART analog output signal type. Changes to these properties do not require a download.

Test Readback Path

The path to the parameter in the associated module that the test uses for comparison. The test compares this parameter value to the Expected Readback Values at each test step.

Test Readback Units

Determines whether the expected values are in percent or mA.

Number of Test Steps

The number of test points for the loop test.

Test Value (EU)

For each step, the value that is written to the function block in the readback path.

Expected Value Tolerance

The amount the actual value can deviate from the expected value and still pass the test, specified in percent of span.

Settling Time

The wait time between writing the test value and reading the expected value. Select from one of the values in the drop-down list. The software calculates the value of Automatic as follows: 3 seconds + (2 * module scan rate).